能量色散X射線光譜(EDS) | 台灣精品獎-歷屆得獎名單
![能量色散X射線光譜(EDS)](https://i.imgur.com/DERULla.jpg)
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Energy Dispersive X-ray Spectroscopy (EDS) is a chemical analysis method that can be coupled with the two major electron beam based techniques of Scanning Electron Microscopy (SEM)[1], Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM)[2].
EDS, when combined with these imaging tools, can provide spatially resolved elemental analysis from areas as small as 1 nanometer in diameter (STEM). In SEM, the analysis volume is larger and ranges in volume from perhaps 0.1 to 3 microns. The impact of the electron beam on the sample produces x-rays that are characteristic of the elements present on the sample. EDS analysis can be used to determine the elemental composition of individual points, line scans or to map out the lateral distribution of elements from the imaged area.
References Scanning Electron Microsco...能量色散X射線光譜(EDS) | 台灣精品獎-歷屆得獎名單
了解SEM | 台灣精品獎-歷屆得獎名單
EDS能测多深? | 台灣精品獎-歷屆得獎名單
eds分析深度 | 台灣精品獎-歷屆得獎名單
SEM與EDS分析是表面的成分嗎 | 台灣精品獎-歷屆得獎名單
xps和eds的区别 | 台灣精品獎-歷屆得獎名單
SEM测试能谱eds | 台灣精品獎-歷屆得獎名單
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如何使用掃描式電子顯微鏡(SEM)進行EDX元素分析 | 台灣精品獎-歷屆得獎名單
XPS 、AES、UPS、EDS 四大能譜分析介紹,材料人必看!!! | 台灣精品獎-歷屆得獎名單
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